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R-PODID PROJECT PUBLICATIONS

Influence of Transfer Molding Process on the Reliability of High Mass Epoxy Mold Compound Molded Package

Dong Hu, Niek van Haare, Albert van Driel, Shatavisha Biswas, Sten Vollebregt, Sebastiaan Kersjes

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Measurement-based analysis of packaged X-Hall current sensors for automotive applications

Mattia Mengozzi, Sana Fatima Syeda, Jacopo Ferretti, Gian Piero Gibiino, Marco Crescentini, Pier Andrea Traverso

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Physics-informed Intelligent Motor Fault Detection on Edge Devices

C.-H. Chen, B. Karanov, Y. Wu, W. van Houtum

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Machine Learning-based Lifetime Prediction and Uncertainty Estimation of GaN HEMTs

C.-H. Chen, B. Karanov, Y. Wu, W. van Houtum

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Transformer-based Motor Fault Detection Using DWT

C.-H. Chen, B. Karanov, Y. Wu, W. van Houtum

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Deep Learning Based Lifetime Prediction on p-GaN Gate HEMTs

C.-H. Chen, B. Karanov, Y. Wu, W. van Houtum

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Register Blocking: A Source-to-Source Analytical Modelling
Approach for Affine Loop Kernels

T. Anthimopoulos, G. Keramidas, V. Kelefouras, I. Stamoulis

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Common Mode Impedance Measurement of Three Phase Motors Using Pulse Frequency Response Analysis

H. Khanbabaei, A. Roc’h

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Integrated Hall-Effect Broadband Current Sensor with a SiC Traction Inverter

M. Mengozzi, G. P. Gibiino, J. Ferretti, M. Nerone, I. Valic, F. Ferrarese, S. F. Syeda, M. Crescentini, P. A. Traverso

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New Frontiers of Wide-Bandgap Semiconductors-Based Power Electronics: Novel Architectures and Reliability

Z. Dahrouch, S. Patané, M. Calabretta, V. Crupi

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A CNN Compression Methodology for Layer-Wise Rank Selection Considering Inter-Layer Interactions

M. Kokhazadeh, G. Keramidas, V. Kelefouras, I. Stamoulis

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HTRB effects on threshold instability of 4H-SiC PowerMOSFET with carrots defects

L. Anoldo, G. Tosto, Z. Dahrouch, S. Bevilacqua, E. Schroer, S. Patanè & A. Russo

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